Control and Systems Approaches to Atomic Force Microscopy
نویسندگان
چکیده
The atomic force microscope (AFM) and its derivative technologies have heralded a new era in science and technology. AFM and related instruments were primarily designed by physicists. In recent years there is a substantial presence of engineers with controls and systems background who are contributing to AFM related technologies. This article provides a tutorial on the control and systems approaches to AFM. This paper also delineates the impact controls and systems perspectives have on AFM related research and indicates future directions.
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